Abstract
CONTINUOUS direct recording of electron diffraction patterns as specimens are prepared inside the diffractometer1,2 increases the sensitivity of observations possible with thin films. Diffraction profiles can be obtained with good signal to noise ratio from films of average thickness equal to a single layer of atoms.
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References
Grigson, C. W. B., Dove, D. B., and Stilwell, G. R., Nature, 205, 1198 (1965).
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Grigson, C. W. B., and Barton, E. A. (to be published).
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GRIGSON, C. Lattice Contractions in Microcrystals of Nickel–Iron. Nature 212, 749–750 (1966). https://doi.org/10.1038/212749b0
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DOI: https://doi.org/10.1038/212749b0
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