Abstract
THE spectrophotometric method of measuring the thickness of thin transparent films on solid surfaces has been used increasingly in recent years1–5. The intensity of a light beam reflected from the film-bearing surface is measured at different wavelengths. A plot of percentage transmission against wavelength takes the form shown in Fig. 1.
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References
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HUGHES, R. Extension of the Spectrophotometric Method for Measuring Thin Films on Solid Substrates. Nature 212, 1350–1351 (1966). https://doi.org/10.1038/2121350a0
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DOI: https://doi.org/10.1038/2121350a0
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