Abstract
AN improved system for scanning electron diffraction has recently been developed in this laboratory. The main improvements on the earlier system of Grigson1,2 are greater stability and sensitivity of the diffraction instrument and a more accurate display ; moreover, provision is made for evaporating specimens, so that intensity profiles from a growing film are obtained ; and the diffraction patterns may be scanned in two dimensions.
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References
Grigson, C. W. B., Nature, 192, 647 (1961).
Grigson, C. W. B., J. Electronics and Control, 12, 209 (1962).
Grigson, C. W. B., Dove, D. B., and Stilwell, G. R., Nature, 204, 173 (1964).
Behrndt, K. H., and Love, R. W., Vacuum, 12, 1 (1962).
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GRIGSON, C., DOVE, D. & STILWELL, G. Some Applications of an Improved Scanning Electron Diffraction System. Nature 205, 1198–1199 (1965). https://doi.org/10.1038/2051198a0
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DOI: https://doi.org/10.1038/2051198a0
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