Abstract
IN some experiments reported in 19571 on the transfer of material by electrons of a few hundred volts energy, bombarding targets of barium, strontium, sodium and cæsium, it was noticed that the enlarged electron microscope image of the emitter showed unresolved changes in contrast (as well as in emission) only when material had been deposited on it. It was established that a portion of this was brought to the emitter in the form of positive ions, which, guided by the electron-optical field between emitter and target, came back to form random regions about 100µ, in diameter.
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References
J. Electronics and Control, 3, 339 (1957).
J. App. Phys., 24, 860 (1953).
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JACOB, L. Detection of Single Slow Ions : a Method of Pressure Measurement. Nature 198, 774–775 (1963). https://doi.org/10.1038/198774b0
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DOI: https://doi.org/10.1038/198774b0
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