Abstract
ELECTRON optical enlargement of X-ray absorption micrographs has been discussed by Pattee1 and Asunmaa2. A contact micrograph is recorded on a thin layer of material sensitive to X-rays in which the absorbed radiation promotes physical or chemical changes that modify the areal electron density. For example, there may be a decomposition resulting in soluble products which are afterwards removed3. A relief image with details of submicroscopic scale then shows an electron optical contrast. For electron optical enlargement of an X-ray absorption micrograph (instead of a replica of it) certain conditions are necessary, particularly if the electron micrograph is to reproduce the quantitative properties of the X-ray absorption images2.
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References
Patteee, jun., H. H., Stockholm X-ray Symposium 1959 (Elsevier Pub. Co., Amsterdam) (in the press).
Asunmaa, S. K., Stockholm X-ray Symposium.
Ladd, W. A., and Ladd, M. W., “X-ray, Microscopy”, 383, edit. by Cosslett et al. (Academic Press, New York, 1957).
Goldberg, E., Z. tech. Phys., 7, 500 (1926).
v. Borries, B., and Lenz, F., Electron Microscopy Proceedings of Stockholm Conference, 1956, p. 60 (Academic Press, New York, 1957).
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ASUNMAA, S. Silver-activated Nitrocellulose as Recording Material for X-Ray Microscopy. Nature 186, 1036–1037 (1960). https://doi.org/10.1038/1861036b0
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DOI: https://doi.org/10.1038/1861036b0
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