Abstract
WE have used X-ray emission spectrography1 (X-ray fluorescence) for rapid and accurate direct analysis of small quantities of material by a technique resembling that of the familiar spot test2. Our results on zinc (Fig. 1) show the simplicity and speed of the method.
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References
Von Hevesy, G., “Chemical Analysis by X-Ray and its Applications” (McGraw-Hill, 1932).
Feigl, F., “Qualitative Analysis by Spot Tests” (New York, Elsevier Pub. Co., 1946). Winslow, E. H., and Liebhafsky, H. A., Anal. Chem., 21, 1338 (1949).
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PFEIFFER, H., ZEMANY, P. Trace Analysis by X-Ray Emission Spectrography. Nature 174, 397 (1954). https://doi.org/10.1038/174397a0
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DOI: https://doi.org/10.1038/174397a0
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