Abstract
IN a recent communication1 a brief description was given of a multiple-beam interference method which can reveal submicroscopic detail upon the surfaces of crystals, and some preliminary data for cleavage faces of mica and selenite were recorded. This method has now been applied to reveal the topographical features of a highly lustrous (100) face of a left-handed quartz crystal. Typical interference contours for this face are shown in Fig.1 and 2. The particular pattern recorded in any exposure is determined by the angle of inclination between the interference surfaces, and the contour patterns, although superficially different, give the same interpretation of surface structure when this is taken into account.
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References
NATURE, 152, 722 (1943).
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TOLANSKY, S. Topography of a Quartz Crystal Face. Nature 153, 195–196 (1944). https://doi.org/10.1038/153195b0
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DOI: https://doi.org/10.1038/153195b0
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