Since its development over 20 years ago, aberration correction has revolutionized the way we study materials at the atomic scale. Here, I outline a set of technical developments for electron microscopes that, when implemented and combined, will enable us to better understand how matter behaves.
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Acknowledgements
The author acknowledges support from the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. The author would also like to thank to O. L. Krivanek, N. Dellby, J. Rusz, S. J. Pennycook, A. Konečná, R. F. Klie, R. E. Dunin-Borkowski, N. Shibata, R. Ishikawa and A. R. Lupini for the countless stimulating discussions and emails through many years about some of the topics covered in this essay.
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Idrobo, J.C. A new resolution quest in electron microscopy. Nat Rev Mater 6, 100–102 (2021). https://doi.org/10.1038/s41578-020-00275-8
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DOI: https://doi.org/10.1038/s41578-020-00275-8
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