Abstract
WE have developed a method for studying the structure of thin films during the earliest stages of growth. The method is based on small angle electron diffraction1–3 and is more sensitive than in situ electron microscopy.
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References
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TOMPSETT, M., HERITAGE, M. & GRIGSON, C. Small Angle Filtered Electron Diffraction from Growing Films. Nature 215, 498–499 (1967). https://doi.org/10.1038/215498a0
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DOI: https://doi.org/10.1038/215498a0
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