Abstract
CERTAIN treatments of crystal surfaces result in the formation of surface layers with physical properties different from those of the undisturbed material1–3. It has hitherto been possible to measure the thickness of such a layer only by etching it away until the properties of the surface thereby revealed correspond to those of the crystal as a whole4. This method is unsatisfactory in that the effect of etching is uncertain : it does not take place uniformly, and it results in pitting, which may lead to erroneous estimates of layer thickness.
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HIRSCH, P., KELLAR, J. Surface Layers of Crystals. Nature 162, 609–610 (1948). https://doi.org/10.1038/162609a0
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DOI: https://doi.org/10.1038/162609a0
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