Abstract
IN a series of communications, Patterson1 and Harker2 have introduced a new method of exhibiting the data contained in X-ray photographs of a crystal with the view of facilitating the use of such data for the determination of the atomic arrangement in the crystal. The essential feature of this type of analysis lies in the use of special Fourier series by means of which it is theoretically possible to construct a three-dimensional 'vector' map of a crystal, regarded as a distribution in space of positive and negative point intensities, superposed upon a continuously varying volume distribution of electrons. These maps represent, not the distribution of the point intensities in space, which is of course the objective of crystal analysis, but vector distances between them taken two at a time. The question then arises as to how far it is possible to derive from point intensity distributions in Vector' space, S2, corresponding point intensity distributions in 'atomic' space, S1.
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References
Patterson, Phys. Rev., 46, 372 (1934); Z. Krist., 90, 517 (1935).
Harker, J., Chem. Phys., 4, 381 (1936).
Llewellyn, Cox and Goodwin, J. Chem. Soc. 883 (1937).
Crowfoot, Proc. Roy. Soc., A, 164, 580 (1938).
Wrinch, Science, 85, 566 (1937); Trans. Faraday Soc., 33, 1369 (1937).
Wrinch, Science, 88, 148 (1938).
Wrinch and Langmuir, J. Amer. Chem. Soc., in the Press.
Bernal, Réunion Internationale de Physique, Chimie et Biologie, Paris, 407, 1937.
Crowfoot, loc. cit., Fig. 1.
Crowfoot, loc cit., Fig. 3.
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Langmuir, I., Wrinch, D. Vector Maps and Crystal Analysis. Nature 142, 581–583 (1938). https://doi.org/10.1038/142581a0
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DOI: https://doi.org/10.1038/142581a0
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